http://blog.livedoor.jp/nichepcgamer/archives/1072291674.html

-AS = Full Spec for SSD (100%)
-AL = Full Spec for USB/SD and low end SSD (100%)
-AF = Full Spec for low end USB/SD (100%)
-AR = Relaxed Spec (see Functional Density)
-S5 = Partially tested, est yield of 50%
-S7 = Partially tested, est yield of 70%
-S8 = Partially tested, est yield of 80%
-S9 = Partially tested, est yield of 90%
-SG = Simple Test Passers/Extended Test Failures
(シンプルテストに合格 / 拡張テストに失敗)
-SS = SImple Test Failures
-ES = Engineering Sample